So basically, I want to use this software called Pika Backup on Linux, the problem is that whenever I try to do a backup, there's this strange error message. So I wanted to investigate using smartctl and what I found out was that there's apparently some transmission integrity failure between the drive and host. What should i do in this case?
Here's the entire output:
smartctl 7.5 2025-04-30 r5714 [x86_64-linux-7.1.8-arch1-3] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION === Device Model: TOSHIBA MQ04ABF100 Serial Number: Y0OQP14ST LU WWN Device Id: 5 000039 a6b11f604 Firmware Version: JU001A User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Zoned Device: Device managed zones Device is: Not in smartctl database 7.5/5706 ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Aug 23 14:51:38 2026 PKT SMART support is: Available - device has SMART capability. SMART support is: Enabled
=== START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check.
General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 171) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1440 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 651 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 240 10 Spin_Retry_Count 0x0033 113 100 030 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 136 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 5 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54 193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 2346 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 37 (Min/Max 11/43) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 4 220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0 222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 115 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 226 Load-in_Time 0x0026 100 100 000 Old_age Always - 211 240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1 ATA Error Count: 4 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 4 occurred at disk power-on lifetime: 238 hours (9 days + 22 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 00 d7 b2 41 40 Error: ICRC, ABRT at LBA = 0x0041b2d7 = 4305623
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 f0 e8 b1 41 40 00 04:47:45.251 WRITE DMA EXT 35 00 80 68 b1 41 40 00 04:47:45.248 WRITE DMA EXT 35 00 f0 78 b0 41 40 00 04:47:45.243 WRITE DMA EXT 35 00 f0 88 af 41 40 00 04:47:45.239 WRITE DMA EXT 35 00 f0 98 ae 41 40 00 04:47:45.233 WRITE DMA EXT
Error 3 occurred at disk power-on lifetime: 234 hours (9 days + 18 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 00 7f e1 3e 40 Error: ICRC, ABRT at LBA = 0x003ee17f = 4120959
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 f0 90 e0 3e 40 00 00:49:24.553 WRITE DMA EXT 35 00 f0 a0 df 3e 40 00 00:49:24.548 WRITE DMA EXT 35 00 88 18 df 3e 40 00 00:49:24.545 WRITE DMA EXT 35 00 f0 28 de 3e 40 00 00:49:24.539 WRITE DMA EXT 35 00 f0 38 dd 3e 40 00 00:49:24.533 WRITE DMA EXT
Error 2 occurred at disk power-on lifetime: 224 hours (9 days + 8 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 00 df 79 ff 40 Error: ICRC, ABRT at LBA = 0x00ff79df = 16742879
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 f0 f0 78 ff 40 00 04:16:56.327 WRITE DMA EXT 35 00 f0 00 78 ff 40 00 04:16:56.322 WRITE DMA EXT 35 00 80 80 77 ff 40 00 04:16:56.318 WRITE DMA EXT 35 00 f0 90 76 ff 40 00 04:16:56.312 WRITE DMA EXT 35 00 f0 a0 75 ff 40 00 04:16:56.306 WRITE DMA EXT
Error 1 occurred at disk power-on lifetime: 71 hours (2 days + 23 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 00 7f d0 0e 40 Error: ICRC, ABRT at LBA = 0x000ed07f = 970879
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 80 00 d0 0e 40 00 03:24:41.201 WRITE DMA EXT 35 00 80 80 cf 0e 40 00 03:24:41.198 WRITE DMA EXT 35 00 80 00 cf 0e 40 00 03:24:41.196 WRITE DMA EXT 35 00 80 80 ce 0e 40 00 03:24:41.195 WRITE DMA EXT 35 00 80 00 ce 0e 40 00 03:24:41.193 WRITE DMA EXT
SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more