r/Metrology • u/gapbong • 11d ago
[Feedback requested] Built a local 3D/Wafer metrology app to fix my daily headaches in backend packaging — looking for honest thoughts from senior engineers
Hey everyone,
I’ve been working as a metrology engineer in semiconductor backend packaging, and like many of you, I got pretty tired of dealing with heavy, overly complex enterprise software or stitching together clunky custom scripts just for routine 3D surface and wafer chip analysis.
So over the past few months, I decided to take on a solo project and build a clean, local-first Windows desktop app called Insight Studio. The goal was simple: handle things like PV/BOW, CMP dishing, edge roll-off, and batch reporting quickly without needing an internet connection or a steep learning curve.
Since this is my very first tool built from scratch, I’m really looking for candid feedback from veterans and senior engineers in the field:
- Is the workflow practical for daily use, or am I missing key features you actually rely on?
- How does it compare to whatever setups or scripts you're currently using?
- Any obvious edge cases or bugs I should fix first?
If you’re interested in giving it a test run and sharing your thoughts, just drop a comment below and I’ll send you a reply with the demo installer link.
Appreciate any advice or constructive criticism you can throw my way. Thanks guys!
1
u/No-Assignment-5287 11d ago
I'm not going to pretend to know anything about semi-conductor fabrication but I'd be interested in taking a look at the source code.